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Next generation ultracapacitor technology promises high performance energy storage benefits January 23, 2012 Next generation ultracapacitor technology promises high performance energy storage benefits In this news analysis article EE Times Europe Power Management's editor, Paul Buckley finds out more about the Ioxus Inc's new iCAP 3,000 Farad ultracapacitor by talking to Chad Hall who is Vice President of Sales for Ioxus Inc and one of the founders of the company.  The new device claims to represent ... Read more Organic photovoltaics offer greener benefits to provide solar cell January 10, 2012 Organic photovoltaics offer greener benefits  to provide solar cell In this news analysis article EE Times Europe Power Management's editor, Paul Buckley quizzes Dr. Martin Pfeiffer, co-founder and CTO of Heliatek GmbH, a global leader and Heliatek's CEO, Thibaud Le Seguillon, to learn more about the high-end solar PV technology company's pioneering developments which ... Read more NXP focuses Cortex-M0 32-bit microcontrollers straight into the 8-bit space November 16, 2011 NXP focuses Cortex-M0 32-bit microcontrollers straight into the 8-bit space In this news analysis article EE Times Europe Analog's editor, Paul Buckley questions Jan Jaap Bezemer, NXP Semiconductors' director of marketing, microcontroller product line, as to the reasons for NXP Semiconductors unveiling a series of new low-pin-count package options for the company's market-leading ... Read more Inphi starts sampling 100-Gigabit Ethernet CMOS PHY solutions to de-risk the development of next generation line cards September 29, 2011 Inphi starts sampling 100-Gigabit Ethernet CMOS PHY solutions to de-risk the development of next generation line cards The next generation 100GbE line cards targeted for data center and enterprise networks face several design challenges when they look to retain a lower carbon footprint while they upgrade to 100GbE networks. In this news analysis article EE Times Europe Analog's editor, Paul Buckley discusses with Siddharth ... Read more
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